| Name | Title | Contact Details |
|---|---|---|
Vanessa Cadenas |
Corporate Counsel | Profile |
Jamie Duncan |
Associate General Counsel | Profile |
Fred Hsu |
Assistant General Counsel | Profile |
Chris Jacobs |
Sr. Director, Legal | Profile |
Lorelei Misajlovich |
Assistant General Counsel | Profile |
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market. Nanometrics was incorporated in California in 1975. Nanometrics has been publicly traded since 1984 and is listed on NASDAQ (NANO). We have been a pioneer and innovator in the field of optical metrology. Nanometrics has an extensive installed base of more than 6,500 systems in over 150 production factories worldwide. Our major customers and original equipment manufacturer (OEM) partners include the largest semiconductor and process equipment manufacturers in the world.
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